AFM-Enabled Scanning Electrochemical Microscopy Launched

A new atomic force microscopy (AFM)-enabled Scanning Electrochemical Microscopy (SECM) mode includes an integrated technology package that enables scientists to perform scanning electrochemical microscopy on conductive and insulating samples.

The system uses an Agilent (Santa Clara, CA, USA) atomic force microscope, which can be used in a time-saving manner, with nanoscale resolution. Agilent designed the SECM mode to deliver both good performance and ease of use. Hours of setup time are eliminated, so data can be collected immediately.

The new SECM mode provides great utility for a broad range of applications. These include investigations of homogeneous and heterogeneous electron transfer reactions, imaging of biologically active processes, surface modification, analysis of thin films (e.g., pinhole detection, conformality), screening of catalytic material (e.g., fuel cell catalysts), and studies of corrosion processes.

At the technological core of Agilent's SECM mode is the novel EC SmartCart, an easy-to-handle cartridge that combines a nanoelectrode with a premounted AFM tip. EC SmartCart probes come pretested and ready-to-scan for Agilent atomic force microscopes. A customized nose cone for the scanner accepts the cartridge.

Produced via microfabrication techniques, the bifunctional probes ensure a constant and controlled distance between the tip-integrated electrode and the sample surface, significantly improving performance. Agilent's EC SmartCart probes enable high-resolution topographical imaging while simultaneously mapping electrochemical information via the AFM probe-integrated electrode.

The probes provide scientists with inherently synchronized structure-activity information. SECM mode also offers scientists industry-leading in situ research capabilities. An environmental chamber and special sample plates designed specifically for EC applications, as well as a new dual-chamber glove box that fits within an acoustic isolation chamber, enhance experimental control. In addition, a built-in potentiostat affords scientists a series of different sensitivity settings covering four orders of magnitude of currents. Full-featured Agilent PicoView software further extends experimental flexibility and control plus functions for Chronoamperometry and Differential Pulse Voltammetry experiments, among others. Agilent's new SECM mode can improve the vision of electrochemistry science at the nanoscale.

An environmental chamber and special sample plates designed specifically for EC applications, as well as a new dual-chamber glove box that fits within an acoustic isolation chamber, enhance experimental control. In addition, a built-in potentiostat affords scientists a series of different sensitivity settings covering four orders of magnitude of currents.

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