New Microscope Meets Nanoresearch Needs

A powerful electron microscope has been developed that has sub-Angstrom resolution and high resolution. The microscope is easy to use and was designed to meet the requirements of nanoresearch and industry.

The Titan scanning transmission electron microscope (S/TEM) is the product of FEI Company (Hillsboro, OR, USA). The Titan is designed as a dedicated and highly upgradeable aberration-correction system that will enable corrector and monochromator technology to enter into mainstream nanotechnology research and industrial markets.

The microscope has won four awards for its design, performance, and innovation. These awards include the iF award bestowed by the International Design Forum in Germany, and the Innovative Product of the Year award presented by the Oregon Tech Awards in the United States. The electron microscope was also selected by several U.S. editorial boards as one of the top products of 2005.

The import of ultra-high resolution imaging continues to grow as advanced research work continues deep into the nanoscale, as semiconductor manufacturers push beyond 45 nm mode for design manufacturing, and as government regulatory agencies around the world see a growing need to characterize the smallest of molecules.

The first Titan S/TEMs were installed in the second half of 2005. Additional installations are currently underway around the world. FEI is increasing production to keep up with demand. FEI's tools for nanotech feature ion-and electron-beam technologies, deliver three-dimensional (3D) characterization, analysis, and modification capabilities with resolution down to sub-Angstrom levels.



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